Structured Illumination Microscopy
Structured Illumination Microscopy (SIM) is a technique, which overcomes the diffraction limit by using a patterned illumination and hence creating a moaré effect in the image. An image with twice the resolution in all three spatial dimensions can then be calculated from the known illumination pattern and the recorded image.
Page under construction!
The principle of SIM: The sample is illuminated by a striped pattern. Different illumination rotations creates different Moaré patterns in the image.
BPAE cell stained with Mitotracker Red. Left: Widefield, Right: SIM