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University of Gothenburg
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Structured Illumination Microscopy

Structured Illumination Microscopy (SIM) is a technique, which overcomes the diffraction limit by using a patterned illumination and hence creating a moaré effect in the image. An image with twice the resolution in all three spatial dimensions can then be calculated from the known illumination pattern and the recorded image.

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Different Moaré patterns are created in the SIM microscope by illuminating the sample with a striped pattern, which is rotated.
The principle of SIM: The sample is illuminated by a striped pattern. Different illumination rotations creates different Moaré patterns in the image.
BPAE cell stained with Mitotracker Red. Left: Widefield, Right: SIM