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An Ion Beam Guidance Control Tool

Conference paper
Authors Lars Bengtsson
Published in Proceedings of the 5th International Conference on Sensors and Electronic Instrumentation Advances
ISBN 978-84-09-14413-6
Publisher International Frequency Sensor Association (IFSA) Publishing
Publication year 2019
Published at Department of Physics (GU)
Language en
Keywords Ion optics, Aperture, Pico ammeter, Guarding technique, Microcontroller.
Subject categories Atom and Molecular Physics and Optics, Accelerator Physics and Instrumentation, Electronics, Embedded Systems


A versatile tool for ion beam line up is proposed. This tool will be used at the CERN-ISOLDE facility in negative ion experiments. Apertures in the ion optics are used to guide the beam and traditionally the current is measured on the apertures in order to detect the presence of an ion beam. By slitting the aperture into four separate pieces, the aperture current can also be used to determine the direction of the misalignment and the size of the ion beam diameter. A 4-channel pico ammeter with optical LED indication of the ion beam position is suggested in an analog/digital hybrid design. The design utilizes two charge/current-to-digital chips in a microcontroller design.

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