To the top

Page Manager: Webmaster
Last update: 9/11/2012 3:13 PM

Tell a friend about this page
Print version

Examination of fragment i… - University of Gothenburg, Sweden Till startsida
To content Read more about how we use cookies on

Examination of fragment ions of polystyrene in TOF-SIMS spectra using MS/MS

Journal article
Authors T. Kawashima
T. Kurosawa
S. Aoyagi
S. Sheraz
John S. Fletcher
M. Futigami
N. P. Lockyer
J. C. Vickerman
Published in Surface and Interface Analysis
Volume 46
Pages 92-95
ISSN 0142-2421
Publication year 2014
Published at Department of Chemistry and Molecular Biology
Pages 92-95
Language en
Keywords TOF-SIMS, MS/MS, collision induced dissociation, polystyrene, qualitative analysis, Chemistry, Physical
Subject categories Materials Chemistry


In this study, tendencies of ionization and cleavage processes of time-of-flight (TOF)-SIMS were examined using MS/MS, which enables an easy qualitative analysis of organic matters, to clarify the fragment ions showing structures of the organic materials. In this paper, a result of reviewing fragment ions in TOF-SIMS spectra for polystyrene (PS) as the representative material is shown. Samples were measured with collision induced dissociation (CID)-MS/MS of 1200L (Varian Inc., USA) and TOF-SIMS J105 (Ionoptika Ltd, UK) for the examination of fragment ions of the PS in TOF-SIMS spectra. The use of CID MS/MS with a wide range of energy distribution is effective for the study of the ionization and cleavage process of TOF-SIMS. As a result, the fragment ions representing the PS structure were clarified, which is useful for the material definition. The qualitative analysis was also applied to the fragment ions particularly obtained in this examination. It is suggested that the examination of the fragmentation process using MS/MS is useful for the mass spectra analysis of organic materials in TOF-SIMS. Copyright (c) 2014 John Wiley & Sons, Ltd.

Page Manager: Webmaster|Last update: 9/11/2012

The University of Gothenburg uses cookies to provide you with the best possible user experience. By continuing on this website, you approve of our use of cookies.  What are cookies?