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Analysis of liposome model systems by time-of-flight secondary ion mass spectrometry

Conference paper
Authors Jelena Lovric
Jacqueline Keighron
Tina B. Angerer
Xianchan Li
Per Malmberg
John S. Fletcher
Andrew G Ewing
Published in Surface and Interface Analysis: 19th International Conference on Secondary Ion Mass Spectrometry (SIMS)
ISSN 0142-2421
Publication year 2014
Published at Department of Chemistry and Molecular Biology
Language en
Links dx.doi.org/10.1002/sia.5623
Keywords liposome, aqueous two-phase system, histamine, ToF-SIMS, depth profile analysis, imaging
Subject categories Chemical Engineering

Abstract

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an important technique for studying chemical composition of micrometer scale objects because of its high spatial resolution imaging capabilities and chemical specificity. In this work, we focus on the application of ToF-SIMS to gain insight into the chemistry of micrometer size liposomes as a potential model for neurotransmitter vesicles. Two models of giant liposomes were analyzed: histamine and aqueous two-phase system-containing liposomes. Characterization of the internal structure of single fixed liposomes was carried out both with the Bi-3(+) and C-60(+) ion sources. The depth profiling capability of ToF-SIMS was used to investigate the liposome interior.

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