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Cluster and polyatomic primary ion beams

Chapter in book
Authors John S. Fletcher
Christopher Szakal
Published in ToF-SIMS: Materials Analysis by Mass Spectrometry, 2nd Ed.
Pages 291-310
ISBN 978-1-906715-17-5
Publisher IM Publications LLP & Surface Spectra Ltd
Place of publication Chichester & Manchester
Publication year 2013
Published at Department of Chemistry and Molecular Biology
Pages 291-310
Language en
Links www.impublications.com/shop/tof-sim...
Subject categories Surfaces and interfaces, Analytical Chemistry, Materials Chemistry
Page Manager: Webmaster|Last update: 9/11/2012
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