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Secondary Ion Mass Spectrometry: Characterizing Complex Samples in Two and Three Dimensions.

Review article
Authors John S. Fletcher
John C Vickerman
Published in Analytical chemistry
Volume 85
Issue 2
Pages 610-639
ISSN 1520-6882
Publication year 2013
Published at Department of Chemistry and Molecular Biology
Pages 610-639
Language en
Links dx.doi.org/10.1021/ac303088m
Subject categories Analytical Chemistry
Page Manager: Webmaster|Last update: 9/11/2012
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