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Effects of Cryogenic Sample Analysis on Molecular Depth Profiles with TOF-Secondary Ion Mass Spectrometry

Journal article
Authors Alan M. Piwowar
John S. Fletcher
Jeanette Kordys
Nicholas P. Lockyer
Nicholas Winograd
John C. Vickerman
Published in Analytical Chemistry
Volume 82
Issue 19
Pages 8291-8299
Publication year 2010
Published at
Pages 8291-8299
Language en
Subject categories Analytical Chemistry
Page Manager: Webmaster|Last update: 9/11/2012

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