To the top

Page Manager: Webmaster
Last update: 9/11/2012 3:13 PM

Tell a friend about this page
Print version

TOF-SIMS analysis using C… - University of Gothenburg, Sweden Till startsida
To content Read more about how we use cookies on

TOF-SIMS analysis using C-60- effect of impact energy on yield and damage

Journal article
Authors John S. Fletcher
X. A. Conlan
E. A. Jones
G. Biddulph
N. P. Lockyer
J. C. Vickerman
Published in Analytical Chemistry
Volume 78
Issue 6
Pages 1827-1831
ISSN 0003-2700
Publication year 2006
Published at
Pages 1827-1831
Language en
Subject categories Analytical Chemistry
Page Manager: Webmaster|Last update: 9/11/2012

The University of Gothenburg uses cookies to provide you with the best possible user experience. By continuing on this website, you approve of our use of cookies.  What are cookies?