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Electron spectroscopy of rare-gas clusters irradiated by x-ray free-electron laser pulses from SACLA

Journal article
Authors H. Fukuzawa
T. Tachibana
K. Motomura
W. Q. Xu
K. Nagaya
S. Wada
P. Johnsson
M. Siano
S. Mondal
Y. Ito
M. Kimura
T. Sakai
K. Matsunami
H. Hayashita
J. Kajikawa
X. J. Liu
E. Robert
C. Miron
Raimund Feifel
J. P. Marangos
K. Tono
Y. Inubushi
M. Yabashi
M. Yao
K. Ueda
Published in Journal of Physics B-Atomic Molecular and Optical Physics
Volume 49
Issue 3
Pages artikel nr 034004
ISSN 0953-4075
Publication year 2016
Published at Department of Physics (GU)
Pages artikel nr 034004
Language en
Keywords rare-gas cluster, nanoplasma, XFEL, ionization, dynamics, size, Optics, Physics
Subject categories Optics


We have measured electron energy spectra and asymmetry parameters of Ar clusters and Xe clusters illuminated by intense x-rays at 5 and 5.5 keV. A velocity map imaging spectrometer was developed for this purpose and employed at an x-ray free-electron laser facility, SACLA in Japan. The cluster size dependence and the peak fluence dependence of the electron spectra and asymmetry parameters are discussed.

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