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ToF-SIMS Studies of Sulfuric Acid Hydrate Films

Journal article
Authors John S. Fletcher
Alex Henderson
Andrew B. Horn
John C. Vickerman
Published in Journal of Physical Chemistry B
Volume 108
Issue 19
Pages 5960–5966
ISSN 1520-6106
Publication year 2004
Published at
Pages 5960–5966
Language en
Subject categories Analytical Chemistry, Meteorology and Atmospheric Sciences


A variety of sulfuric acid hydrate films, formed by the co-deposition of SO3 and H2O on a cooled substrate, have been analyzed using time-of-flight secondary ion mass spectrometry (ToF-SIMS). The films were produced using procedures developed in recent infrared spectroscopic studies. Spectra have been shown to consist of a series of identifiable fragments, the change in intensities of which can be related to changes in temperature and the relative abundance of H2O during the deposition of the film under UHV conditions. Depth profiling of the films shows clear evidence of separate surface species on some films and supports the existence of surface molecular hydrates over a stable bulk hydrate film

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